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Quantum Scale participated in the First National Conference on Surface and Interface Science of the Chinese Chemical Society: Jointly exploring the frontiers of surface and interface science and technology.

Published Time:

2025/05/14

At the exhibition, Scaling Quantum launched an iterative new product of the atomic force microscope - AFM (Nano Tech 10). It has achieved the integration of multiple modes such as contact scanning, tapping scanning, electrostatic force scanning, magnetic force scanning, force curve, Kelvin function, etc. Its AFM has a resolution at the nanometer or even sub-nanometer level, with a lateral resolution reaching 0.2 nm and a longitudinal resolution as low as 0.05 nm (closed loop). It supports the nanoscale topography analysis of the material surface and covers the observation from the macroscopic features at the micrometer scale to the microscopic structures at the atomic level.

From May 9th to 12th, 2025, the First National Conference on Surface and Interface Science of the Chinese Chemical Society was grandly held at the Chengdu Tianfu International Conference Center. As an important participant in the field of atomic and surface imaging technology, Scaling Quantum showcased its cutting-edge technologies and solutions at Booth #B42, and engaged in discussions with domestic and foreign academicians, experts, scholars, and industry colleagues on the innovative applications of surface and interface science in fields such as energy and materials.

Domestic Mainstay

Redefining the Benchmark of Atomic Force Microscopy

At the exhibition, Scaling Quantum launched an iterative new product of the atomic force microscope - AFM (Nano Tech 10).

It has achieved the integration of multiple modes such as contact scanning, tapping scanning, electrostatic force scanning, magnetic force scanning, force curve, Kelvin function, etc. Its AFM has a resolution at the nanometer or even sub-nanometer level, with a lateral resolution reaching 0.2 nm and a longitudinal resolution as low as 0.05 nm (closed loop). It supports the nanoscale topography analysis of the material surface and covers the observation from the macroscopic features at the micrometer scale to the microscopic structures at the atomic level.