
Product Features
The high-speed atomic force microscope system overcomes the biggest disadvantage of the traditional AFM, "slow scanning speed", and realizes real-time animation observation of reactions and structural changes that can only be caused in solution.
Since images can be obtained in a short time, the endurance to the shaking and vibration of the sample is strong, and there is no need to fix a solid anchor ring on the substrate. Therefore, observation can be carried out without damaging the reactivity of biological samples.
● The high-speed drive scanner, which can be selected from 4 types
, can scan at a speed 1,000 times faster than before through a unique anti-resonance mechanism. The independent drive of each piezoelectric in the three axes of X, Y, and z enables nano-scale imaging with little distortion even at high-speed scanning. In addition to the standard scanner, there are also solution injection scanners that can add reagents and enzymes, wide-area scanners that can observe a wide range, and ultra-high-speed scanners with further improved time resolution, which can be selected according to the purpose.
● Ultra-micro cantilever with high resonance frequency and low spring constant
A micro cantilever with a length of about 10um is used. Although the resonance frequency in the solution is about 500KHz, the spring constant is 0.1Nm, which allows high-speed scanning without damaging soft samples such as biological samples.
● High-speed and stable feedback control
A high-speed and high-precision feedback mechanism is used. This enables precise and true observation of the sample surface under high-speed scanning.
In addition, the optional offset compensation enables long-term stable observation.

Brownian motion of interstitial point defects in a two-dimensional streptavidin lattice

Keyword: High-Speed Industrial Atomic Force Microscope AFM-HS
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