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Product Features
Imaging mode: equipped with contact scanning, tapping scanning, electrostatic force scanning, magnetic force scanning, force curve, Kelvin function
Closed-loop resolution: XY axis: 0.2 nm, Z axis: 0.05 nm
Scanning range: XY axis: 40 μm × 40 μm, Z axis: 8 μm (upgradeable to 100 μm optional)
Conductive samples, insulating samples, biological samples Surface morphology and physical and chemical properties detection
(maximum sample size: 2.5 cm x 1 cm)
(Sample moving range: 12 cm x 12 cm)
Technical Parameters
Application Areas
Semiconductor wafer defect detection; material surface morphology, roughness, mechanical properties, local electrical properties, etc.; life sciences; biomedicine.
Product Imaging
Tap Mode
Contact Mode
Force curve
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| Surface charge distribution | Magnetic domain | Magnetic Bubble | Surface potential | Helical structure | ||
Keyword： Atomic Force Microscope AFM-NanoTech10
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