Blogs
2025/05/14
At the exhibition, Scaling Quantum launched an iterative new product of the atomic force microscope - AFM (Nano Tech 10).
It has achieved the integration of multiple modes such as contact scanning, tapping scanning, electrostatic force scanning, magnetic force scanning, force curve, Kelvin function, etc. Its AFM has a resolution at the nanometer or even sub-nanometer level, with a lateral resolution reaching 0.2 nm and a longitudinal resolution as low as 0.05 nm (closed loop). It supports the nanoscale topography analysis of the material surface and covers the observation from the macroscopic features at the micrometer scale to the microscopic structures at the atomic level.
2025/04/27
Application scenario: ST1000 was successfully integrated into the nanomaterial laboratory for graphene defect analysis and two-dimensional material characterization. The user evaluation form shows that "this product can meet the teaching needs of our unit, can easily obtain the surface atomic image of the standard sample, is easy to operate, and has a friendly interface."
Supporting services: Provide a full set of delivery lists and operation training to support the laboratory to quickly engage in teaching and scientific research tasks.
2025/04/27
Application scenarios: Relying on ST1000 to complete the atmospheric two-dimensional material characterization and atomic imaging of standard graphite samples, chromium thiobromide and other materials, users commented that "the imaging resolution is stable and better than 0.1 Å, the operation interface is friendly, and students can get started quickly."